Our Trusted Suppliers
Products & Equipments
As a leading distributor of Testing & Inspection Equipment in India, we partner with renowned global manufacturers to bring you a comprehensive range of solutions. From precise measurement to rigorous analysis, our diverse portfolio caters to a wide spectrum of industries, empowering you to achieve excellence. Beyond providing cutting-edge equipment, we offer comprehensive after-sales support, including installation, training, and maintenance, ensuring your operations run smoothly. Our team of experienced engineers is dedicated to providing expert guidance and tailored solutions to meet your specific needs.
In Circuit Tester
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Component-Level Testing
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Short & Open Circuit Detection
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Automated Test Execution
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Boundary Scan & Functional Testing
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High-Speed Testing & Data Logging
Functional Test Systems
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Verifies device functionality, signal integrity.
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Tests circuit board performance comprehensively.
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Detects manufacturing defects, component failures.
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Ensures product quality, operational reliability.
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Automates testing, improves production efficiency.
Flying Probe Tester
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From small to large sizes line-up
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Sheeting, deforming, inflation, blowing etc
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Precise, Needle-Point Accuracy for Dense PCBs.
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High-Voltage Isolation, Component Value Checks.
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Advanced Software for Detailed Fault Analysis.
X-Ray System
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High-Resolution Imaging
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3D Inspection
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Automated Analysis
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Component-Level Inspection
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Data-Driven Insights
IC Programming Machine
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Supports Wide Chip Range
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High-Speed Programming
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User-Friendly Interface
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Reliable and Durable
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Cost-Effective Solution
Smart Factory Solution
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Achieving high productivity by high speed, high precision and high power
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Achieving high yield of workpiece by stable machining
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Easy operation of peripheral equipment by high expandability
Post Wave AOI
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High-Resolution Inspection
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Detects solder defects like bridging, voids, and insufficient solder
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Improved accuracy and speed for faster throughput
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Various assembly equipment using robots & cameras, palletizing systems
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Automates defect classification for faster analysis